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SOPHISTICATED ANALYTICAL INSTRUMENTATION FACILITY
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      • Field Emission Scanning Electron Microscopy
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      • Small-Angle X-ray Scattering
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      • confocal microscopy
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      • Gas Chromatography-Mass Spectrometry 
      • Rheometer
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CHNSO Analysis

working

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Confocal Microscope Imaging

working

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MASS Spectrometer (GCMS-MS)

NOT Working

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Small Angle X-Ray Scattering

working

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Rheometer

working

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HR-TEM

working

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LATEST ANNOUNCEMENTS

  • Rates are revised from 1st April for all Instruments
    Kindly Check the Revised rate before pay the payment for SAIF as well as CIL instruments.
  • X-ray Photo Electron Spectroscopy facility is available now contact Ms.Ramneek mam
    User can utilize the XPS facility at our SAIF center

UPCOMING INSTRUMENTS

  • ATOMIC FORCE MICROSCOPY
  • RAMAN SPECTROSCOPY
  • FTIR WITH MICROSCOPE
  • ATOMIC FORCE MICROSCOPY
  • FTIR WITH MICROSCOPE
  • RAMAN SPECTROSCOPY

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Important Links

  • RTI Section 4
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Contact Us

Sophisticated Analytical Instrumentation Facility
Sector 14,
Panjab University, Chandigarh- 160014
Phone No. 0172-253 4048,47

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